Customs Tariff Number Position 9031 - Search results (17)

Measuring or checking instruments, appliances and machines not elsewhere specified in chapter 90; profile projectors
Machines for balancing mechanical parts
Test benches for motors, generators, pumps, etc.
Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
903149
Subheading
Optical instruments, appliances and machines for measuring or checking, not elsewhere specified or included in chapter 90
Profile projectors
Optical instruments, appliances and machines for measuring or checking, not elsewhere specified or included in chapter 90
903180
Subheading
Instruments, appliances and machines for measuring or checking, not elsewhere specified in chapter 90 (excl. optical)
Electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
Electronic instruments, apparatus and machines for measuring or checking geometrical quantities (excl. for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices)
Electronic instruments, apparatus and machines for measuring or checking, n.e.s. in chapter 90
Instruments, appliances and machines for measuring or checking geometrical quantities, non-optical, non-electronic (excl. hand-held instruments for measuring length)
Non-electronic and non-optical instruments, apparatus and machines for measuring or checking, n.e.s. in chapter 90
903190
Subheading
Parts and accessories for instruments, appliances and machines for measuring and checking, n.e.s.
Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
Parts and accessories for electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices, n.e.s.
Parts and accessories for instruments, appliances and machines for measuring and checking, n.e.s.