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HS Code 90112010 - photomicrographic microscopes semiconductor wafer handling
Photomicrographic optical microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles (excl. stereoscopic microscopes)
Examples (No official information or warranty)
- Automated wafer inspection microscope with robotic handler
- Mask aligner microscope with reticle cassette loader
- Semiconductor defect review microscope with wafer stage
- Photolithography microscope with automated wafer transport
- Reticle inspection microscope with SMIF pod interface
- Microscope for semiconductor metrology with FOUP compatibility
- Multi-wafer analysis microscope with integrated material handling system
- Mask aligner microscope with reticle cassette loader
- Semiconductor defect review microscope with wafer stage
- Photolithography microscope with automated wafer transport
- Reticle inspection microscope with SMIF pod interface
- Microscope for semiconductor metrology with FOUP compatibility
- Multi-wafer analysis microscope with integrated material handling system
Code Tree Structure / Hierarchy
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9011
Compound optical microscopes, including those for photomicrography, cinephotomicrography or microprojection
901120
Other microscopes, for photomicrography, cinephotomicrography or microprojection
90112010
Photomicrographic microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles
90112090
Other
Trade restrictions and policies
Chapter 90
53 Trade restrictions and policies
Position 9011
3 Trade restrictions and policies
Subheading 901120
2 Trade restrictions and policies
Customs Tariff Number 90112010
1900-01-01
ERGA OMNES (1011)
Third country duty
Regulation 2204/99
1900-01-24
Russian Federation (RU)
Export control
Regulation 0833/14
1900-01-25
Belarus (BY)
Export control
Regulation 0765/06
Changes to this tariff number
Changes in favor of 90112010
1997:
90112000
➜
1998:
90112010