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HS Code 90121000 - Electron, microscopes, proton
Electron microscopes, proton microscopes and diffraction apparatus
Examples (No official information or warranty)
- Transmission electron microscope (TEM)
- Scanning electron microscope (SEM)
- Low-energy electron diffraction (LEED) apparatus
- Reflection high-energy electron diffraction (RHEED) apparatus
- Scanning transmission electron microscope (STEM)
- Field emission electron microscope (FE-SEM)
- Proton microscope (for materials analysis)
- Scanning electron microscope (SEM)
- Low-energy electron diffraction (LEED) apparatus
- Reflection high-energy electron diffraction (RHEED) apparatus
- Scanning transmission electron microscope (STEM)
- Field emission electron microscope (FE-SEM)
- Proton microscope (for materials analysis)
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Trade restrictions and policies
Chapter 90
53 Trade restrictions and policies
Position 9012
5 Trade restrictions and policies
Subheading 901210
3 Trade restrictions and policies
Customs Tariff Number 90121000
1900-01-01
ERGA OMNES (1011)
Third country duty
Regulation 1776/19
1900-01-01
New Zealand (NZ)
Tariff preference
Decision 0244/24
1900-01-15
All third countries (1008)
Export authorization (Dual use)
Regulation 2003/25
Changes to this tariff number
Changes based from 90121000
Changes in favor of 90121000
1997:
90121000
➜
1998:
90121010
1997:
90121000
➜
1998:
90121090
Changes in favor of 90121000
2019:
90121010
➜
2020:
90121000
2019:
90121090
➜
2020:
90121000